Study of microstructure and interfacial interaction in Al-C60 Co-evaporated films

Physica Status Solidi (A) Applied Research

Volumn 163, Issue 2, 1997, Pages 403-409

  Hou, J G ^a   Li, Yongqing ^a   Wang, Yan ^a   Xu, Wentao ^a   Zuo, Jian ^a   Zhang, Y H ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; COBALT; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; DEPOSITION; EVAPORATION; FULLERENES; PHYSICAL PROPERTIES; RAMAN SPECTROSCOPY; SILVER; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

PENTAGON PINCH MODE;

INTERFACES (MATERIALS);

EID: 0031248425     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(199710)163:2<403::AID-PSSA403>3.0.CO;2-D     Document Type: Article

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