Optical Characterization of Free-Standing Porous Silicon Films

Journal of Porous Materials

Volumn 4, Issue 4, 1997, Pages 227-237

  Guha, S ^a   Steiner, Peter ^b   Kozlowski, F ^b   Lang, W ^c  

^a NAVAL RESEARCH LABORATORY   (United States)

^b Fraunhofer Institut fur Festkorpertechnologie   (Germany)

^c Inst F Micro and Info Technology   (Germany)

Author keywords

Absorbtion; Band gap distribution; Photoluminescence; Porous Si; Raman scattering

Indexed keywords

ABSORPTION SPECTROSCOPY; BAND STRUCTURE; CHARACTERIZATION; LIGHT ABSORPTION; MAGNETIC VARIABLES MEASUREMENT; METALLIC FILMS; OPTICAL PROPERTIES; PARAMAGNETIC RESONANCE; PARTICLE SIZE ANALYSIS; PHOTOLUMINESCENCE; POROSITY; RAMAN SCATTERING;

BAND GAP DISTRIBUTION; BLUE SHIFT; ELECTRON SPIN RESONANCE MEASUREMENT; FREE STANDING POROUS SILICON FILMS; QUANTUM CONFINEMENT EFFECT;

POROUS SILICON;

EID: 0031247747     PISSN: 13802224     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1009623204014     Document Type: Article

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