Surface defect characterization in oxygen-dosed nickel surfaces and in NiO thin films by CO adsorption-desorption experiments

Journal of Physical Chemistry B

Volumn 101, Issue 44, 1997, Pages 9069-9076

  Öfner, Helmut ^a   Zaera, Francisco ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CARBON MONOXIDE; CRYSTAL DEFECTS; FILM GROWTH; GAS ADSORPTION; ION BOMBARDMENT; METALLIC FILMS; NICKEL; NICKEL COMPOUNDS; SURFACE STRUCTURE; TEMPERATURE PROGRAMMED DESORPTION; THIN FILMS;

NICKEL OXIDE;

SURFACE TREATMENT;

EID: 0031247655     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp971854h     Document Type: Article

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