Measurement of the wetting angle of nanoparticles using surface melting

Surface Science

Volumn 388, Issue 1-3, 1997, Pages

  Sondergard E ^a   Kofman, R ^a   Cheyssac, P ^a   Celestini, F ^a,c   Ben David, T ^b   Lereah, Y ^b  

^a UNIVERSITÉ CÔTE D'AZUR   (France)

^b TEL AVIV UNIVERSITY   (Israel)

^c SISSA   (Italy)

Author keywords

Clusters; Electron microscopy; Silicon oxides; Solid liquid interfaces; Surface melting; Tin; Wetting

Indexed keywords

ELECTRON MICROSCOPY; MELTING; PARTICLES (PARTICULATE MATTER); PHASE INTERFACES; SILICON COMPOUNDS; SURFACE PHENOMENA; TIN; WETTING;

SURFACE MELTING;

NANOSTRUCTURED MATERIALS;

EID: 0031247479     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00512-8     Document Type: Article

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