Preparation and characterization of Nd3+ and Er3+ -doped silica sol-gel coatings by Rutherford backscattering spectroscopy and spectroscopic ellipsometry

Journal of Materials Research

Volumn 12, Issue 10, 1997, Pages 2779-2783

  Bruynooghe, S ^a   Chabli, A ^a   Bertin, F ^a   Pierre, F ^a   Leflem, G ^b  

^a CEA LETI   (France)

^b INST CHIM MATIERE COND BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DOPING (ADDITIVES); ELLIPSOMETRY; ERBIUM; FILM PREPARATION; NEODYMIUM; REFRACTIVE INDEX; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICA; SILICON; SINGLE CRYSTALS; SOL-GELS;

SPIN COATING;

OPTICAL FILMS;

EID: 0031246957     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1997.0370     Document Type: Article

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