Fastscan z-scan system for determining optical non-linearities in semiconductors

Optics and Laser Technology

Volumn 29, Issue 7, 1997, Pages 355-358

  Blewett, I J ^a   Stokes, J ^a   Tookey, A ^a   Kar, A K ^a   Wherrett, B S ^a  

^a HERIOT WATT UNIVERSITY   (United Kingdom)

Author keywords

Non linear optics; z scan; Zinc selenide

Indexed keywords

LIGHT ABSORPTION; NONLINEAR OPTICS; PHOTONS; SEMICONDUCTING ZINC COMPOUNDS;

Z SCAN SYSTEMS;

SCANNING;

EID: 0031246865     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(97)00035-2     Document Type: Article

References (4)

1. Sheik-Bahae, M., Said, A. A., Wei, T. H., Hagan, D. J., Van Stryland, E. W. Sensitive measurement of optical nonlinearities using a single beam, IEEE J Quantum Electron, 26 (1990) 760-769
2. Brun, A., Georges, P., Le Saux, G., Salin, F. Single-shot characterisation of ultrasort light pulses, J Phys D, 24 (1991) 1225-1233
3. Blewett, I. J., Galbraith, I., Tookey, A., Kar, A., Wherrett, B. S. Comparison of the biexciton and exciton coherent polarisation lifetimes in Znse/(Zn, Cd)Se multiple-quantum-wells, Semicon Sci Tech. 12 (1997) 820-824
4. Said, A. A., Sheik-Bahae, M., Hagan, D. J., Wei, T., Wang, J., Young, J., Van Stryland, E. W. Determination of bound-electronic and free-carrier nonlinearities in ZnSe, GaAs, CdTe and ZnTe, J Opt Soc Am B, 9 (1992) 405-414