A characterization of the γ-glycidoxypropyltrimethoxysilane and aluminium interface by SIMS and XPS

Journal of Materials Science Letters

Volumn 16, Issue 20, 1997, Pages 1675-1676

  Fang, J ^a   Flinn, B J ^a   Leung, Y L ^a   Wong, P C ^a   Mitchell, K A R ^a   Foster, T ^b  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^b Esquimalt Def Research Detachment   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ALUMINUM; BONDING; ION BOMBARDMENT; SECONDARY ION MASS SPECTROMETRY; SILANES; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL SHIFTS;

INTERFACES (MATERIALS);

EID: 0031245908     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018530231931     Document Type: Article

References (14)

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