The scanning Kelvin microscope with voltage modulation: A new principle to image discrete surface potentials

Surface and Interface Analysis

Volumn 25, Issue 11, 1997, Pages 855-859

  Liess, H D ^a   Maeckel, R ^a   Ren, J ^a  

^a BUNDESWEHR UNIVERSITY MUNICH   (Germany)

Author keywords

Scanning Kelvin microscope; Zismann method

Indexed keywords

DISTANCE MEASUREMENT; IMAGE PROCESSING; MICROSCOPIC EXAMINATION; SURFACE STRUCTURE;

CONTACT POTENTIAL DIFFERENCE; SCANNING KELVIN MICROSCOPE;

SURFACE PROPERTIES;

EID: 0031245868     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199710)25:11<855::aid-sia308>3.0.co;2-3     Document Type: Article

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