메뉴 건너뛰기




Volumn 94-95, Issue , 1997, Pages 279-284

Macroscopic modelling of silicon carbide sublimation: Toward a microscopic modelling of defect formation

Author keywords

Defect formation; Macroscopic modelling; Microscopic modelling; Silicon carbide

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL GROWTH; HEAT TRANSFER; INDUCTION HEATING; MASS TRANSFER; MATHEMATICAL MODELS; SINGLE CRYSTALS; SUBLIMATION; THERMAL GRADIENTS; THERMODYNAMICS;

EID: 0031245657     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(97)00339-3     Document Type: Article
Times cited : (10)

References (13)
  • 1
    • 30244533612 scopus 로고
    • G.L. Harris (ed.), Emis datareviews 13, Inspec, London, UK
    • S. Nishido, in G.L. Harris (ed.), Properties of Silicon Carbide, Emis datareviews 13, Inspec, London, UK, 1995, p. 163.
    • (1995) Properties of Silicon Carbide , pp. 163
    • Nishido, S.1
  • 2
    • 0000568706 scopus 로고
    • G.L. Harris (ed.). Emis datareviews 13, Inspec, London, UK
    • A.O. Konstantinov, in G.L. Harris (ed.). Properties of Silicon Carbide, Emis datareviews 13, Inspec, London, UK, 1995, p. 170.
    • (1995) Properties of Silicon Carbide , pp. 170
    • Konstantinov, A.O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.