Improving classifier performance through repeated sampling

Pattern Recognition

Volumn 30, Issue 10, 1997, Pages 1637-1650

  Zhou, Jiangying ^a,b,c   Lopresti, Daniel ^a  

^a Panasonic Corporation of North America   (United States)

^b FUDAN UNIVERSITY   (China)

^c STONY BROOK UNIVERSITY   (United States)

Author keywords

Bayes risk; Classifier; Consensus sequence voting; Optical character recognition; Repeated sampling; Statistical pattern recognition

Indexed keywords

CLASSIFIERS; SAMPLING; STATISTICAL METHODS;

BAYES RISK; CONSENSUS SEQUENCE VOTING; STATISTICAL PATTERN RECOGNITION;

PATTERN RECOGNITION;

EID: 0031244962     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0031-3203(96)00182-3     Document Type: Article

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