Use of carbon black to eliminate surface charging effects in photoelectron spectroscopy measurements of powders

Applied Physics Letters

Volumn 71, Issue 16, 1997, Pages 2262-2264

  Obrovac, M N ^a   Gao, Yuan ^a,b   Richard, M N ^a   Dahn, J R ^a  

^a DALHOUSIE UNIVERSITY   (Canada)

^b FMC CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON BLACK; DEFORMATION; ELECTRON ENERGY LEVELS; PHOTOEMISSION; POWDER METALLURGY; SILICON COMPOUNDS;

SILICON POWDERS; SURFACE CHARGING EFFECTS; VALENCE BAND;

PHOTOELECTRON SPECTROSCOPY;

EID: 0031244863     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120045     Document Type: Article

References (11)

1. T. L. Barr, in Practical Surface Analysis, edited by D. Briggs and M. P. Seah (Wiley, Chichester, 1983), p. 283.
2. A. Cros, J. Electron Spectrosc. Relat. Phenom. 59, 1 (1992).
3. R. Nordberg, H. Brecht, R. G. Albridge, A. Fahlman, and J. R. Van Wazer, Inorg. Chem. 9, 2469 (1970).
4. G. Johansson, J. Hedman, A. Berndtsson, M. Klasson, and R. Nilsson, J. Electron Spectrosc. Relat. Phenom. 2, 295 (1992).
5. D. W. McComsey and W. B. Felegyhazi, Handbook of Batteries, edited by D. Linden (McGraw-Hill, New York, 1995), p. 8.12.
6. See, for example, Shawinigan Acetylene Black data sheet, available from: Chevron Chemical Company, Olefins & Derivatives Division, P.O. Box 3766, Houston, TX 77235.
7. K. H. Tan, G. M. Bancroft, L. L. Coatsworth, and B. W. Yates, Can. J. Phys. 60, 131 (1982).
8. F. R. McFeely, S. P. Kowalczyk, L. Ley, R. G. Cavell, R. A. Pollak, and D. A. Shirley. Phys. Rev. B 9, 5268 (1974).
9. J. J. Yeh and I. Lindau, At. Data Nucl. Data Tables 32, 1 (1985).
10. B. Fischer, R. A. Pollak, T. H. DiStefano, and W. D. Grobman, Phys. Rev. B 15, 3193 (1977).
11. S. T. Pantelides and W. A. Harrision, Phys. Rev. B 13, 2667 (1976).