Composition dependence of electrical properties of Al-Sb thin films

Bulletin of Materials Science

Volumn 20, Issue 7, 1997, Pages 1015-1021

  Nikam, P S ^a  

^a M S G College   (India)

Author keywords

Electrical resistivity; Temperature coefficient of resistance; Three temperature method

Indexed keywords

ACTIVATION ENERGY; COMPOSITION EFFECTS; ELECTRIC CONDUCTIVITY OF SOLIDS; GLASS; GRAIN SIZE AND SHAPE; SEMICONDUCTING ALUMINUM COMPOUNDS; STOICHIOMETRY; SUBSTRATES; THERMAL EFFECTS; THIN FILMS;

THREE TEMPERATURE METHOD;

SEMICONDUCTING FILMS;

EID: 0031244836     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02744890     Document Type: Article

References (6)

1. Charlot G 1964 Colorimetric determination of elements (Amsterdam: Elsevier)
2. Chopra K L 1969 Thin film phenomena (New York: McGraw Hill)
3. Das V D and Karunakaran D 1989 Phys. Rev. B39 10872
4. Francombe M H, Noreika A J, Zeitman S A and Johnson J E 1976 Thin Solid Films 32 259
5. George J and Palson T I 1985 Thin Solid Films 127 233
6. Johnson J E 1965 J. Appl. Phys. 36 3193