-
1
-
-
0016128770
-
Digital wavefront measuring interferometer for testing optical surfaces and lenses
-
J. H. Bruning, D. R. Herriott, J. E. Galagher, P. D. Rosenfeld, A. D. White, and D. J. Brangaccio, “Digital wavefront measuring interferometer for testing optical surfaces and lenses,” Appl. Opt. 13, 2693-2703 (1974).
-
(1974)
Appl. Opt.
, vol.13
, pp. 2693-2703
-
-
Bruning, J.H.1
Herriott, D.R.2
Galagher, J.E.3
Rosenfeld, P.D.4
White, A.D.5
Brangaccio, D.J.6
-
2
-
-
0019531992
-
Optical heterodyne profilometry
-
G. E. Sommargren, “Optical heterodyne profilometry,” Appl. Opt. 20, 610-618 (1981).
-
(1981)
Appl. Opt.
, vol.20
, pp. 610-618
-
-
Sommargren, G.E.1
-
3
-
-
0029195017
-
Computerized interferometric measurement of surface microstructure
-
T. Kasai, ed., Proc. SPIE
-
J. C. Wyant, “Computerized interferometric measurement of surface microstructure,” in International Conference on Optical Fabrication and Testing, T. Kasai, ed., Proc. SPIE 2576, 122-130 (1995).
-
(1995)
Ternational Conference on Optical Fabrication and Testing
, vol.2576
, pp. 122-130
-
-
Wyant, J.C.1
-
4
-
-
0021425530
-
Interferometric measurements of the surface profile of moving samples
-
R. W. Peterson, G. M. Robinson, R. A. Carlsen, C. D. Englund, P. J. Moran, and W. M. Wirth, “Interferometric measurements of the surface profile of moving samples,” Appl. Opt. 23,1464-1466 (1984).
-
(1984)
Appl. Opt.
, vol.23
, pp. 1464-1466
-
-
Peterson, R.W.1
Robinson, G.M.2
Carlsen, R.A.3
Englund, C.D.4
Moran, P.J.5
Wirth, W.M.6
-
5
-
-
0021488281
-
Applications of interferometric measurements of surface topography of moving magnetic recording materials
-
G. M. Robinson, R. W. Peterson, and P. J. Moran, “Applications of interferometric measurements of surface topography of moving magnetic recording materials,” IEEE Trans. Magn. 20, 915-917 (1984).
-
(1984)
IEEE Trans. Magn.
, vol.20
, pp. 915-917
-
-
Robinson, G.M.1
Peterson, R.W.2
Moran, P.J.3
-
6
-
-
0022046908
-
Threedimensional surface metrology of magnetic recording materials through direct-phase detecting microscopic interferometry
-
D. M. Perry, P. J. Moran, and G. M. Robinson, “Threedimensional surface metrology of magnetic recording materials through direct-phase detecting microscopic interferometry,” J. IERE 55,145-150 (1985).
-
(1985)
J. IERE
, vol.55
, pp. 145-150
-
-
Perry, D.M.1
Moran, P.J.2
Robinson, G.M.3
-
7
-
-
0022927369
-
The analysis of interferometrically measured surface roughness data
-
University of Sussex, Brighton, England
-
G. M. Robinson, G. D. Hanson, and K. E. Palmquist, “The analysis of interferometrically measured surface roughness data,” in Proceedings of the Sixth International Conference on Video, Audio, and Data Recording (University of Sussex, Brighton, England, 1986), pp. 1-8.
-
(1986)
Proceedings of the Sixth International Conference on Video, Audio, and Data Recording
, pp. 1-8
-
-
Robinson, G.M.1
Hanson, G.D.2
Palmquist, K.E.3
-
8
-
-
0038294633
-
Optical interferometry of surfaces
-
G. M. Robinson, D. M. Perry, and R. W. Peterson, “Optical interferometry of surfaces,” Sci. Am. 265, 67-71 (July 1991).
-
(1991)
Sci. Am.
, vol.265
, pp. 67-71
-
-
Robinson, G.M.1
Perry, D.M.2
Peterson, R.W.3
-
9
-
-
18444415111
-
Development of high resolution optical heterodyne interferometer
-
K. Miyagi, M. Nanami, and I. Kobayashi, “Development of high resolution optical heterodyne interferometer,” Anritsu Tech. Bull. (Jpn) 71, 96-102 (March 1996).
-
(1996)
Anritsu Tech. Bull. (Jpn)
, vol.71
, pp. 96-102
-
-
Miyagi, K.1
Nanami, M.2
Kobayashi, I.3
-
10
-
-
0024112808
-
Theoretical analysis of video recording
-
A. Eiling, “Theoretical analysis of video recording,” IEEE Trans. Magn. 24, 3249-3258 (1988).
-
(1988)
IEEE Trans. Magn.
, vol.24
, pp. 3249-3258
-
-
Eiling, A.1
-
11
-
-
0025519547
-
The importance of magnetostatics in video recording - a theoretical analysis
-
A. Eiling, “The importance of magnetostatics in video recording - a theoretical analysis,” IEEE Trans. Magn. 26,3173-3179 (1990).
-
(1990)
IEEE Trans. Magn.
, vol.26
, pp. 3173-3179
-
-
Eiling, A.1
-
12
-
-
0026123185
-
Effect of dispersion quality on particulate magnetic recording disk properties
-
M. J. Shah, G. M. Cuka, and T. E. Karis, “Effect of dispersion quality on particulate magnetic recording disk properties,” AIChE J. 37, 394-402 (1991).
-
(1991)
Aiche J
, vol.37
, pp. 394-402
-
-
Shah, M.J.1
Cuka, G.M.2
Karis, T.E.3
-
13
-
-
0026819311
-
Dispersion quality measurement and particulate magnetic coating properties
-
M. J. Shah, G. M. Cuka, and T. E. Karis, “Dispersion quality measurement and particulate magnetic coating properties,” IEEE Trans. Instrum. Meas. 41, 3-9 (1992).
-
(1992)
IEEE Trans. Instrum. Meas.
, vol.41
, pp. 3-9
-
-
Shah, M.J.1
Cuka, G.M.2
Karis, T.E.3
-
14
-
-
0027555712
-
New optical devices for surface roughness measurements
-
T. Wielinga and J. Melissant, “New optical devices for surface roughness measurements,” J. Magn. Magn. Mat. 120,116-118 (1993).
-
(1993)
J. Magn. Magn. Mat.
, vol.120
, pp. 116-118
-
-
Wielinga, T.1
Melissant, J.2
-
15
-
-
0026929032
-
In-line Fabry-Perot interferometer with high-reflectance internal mirrors
-
C. E. Lee, W. N. Gibler, R. A. Atkins, and H. F. Taylor, “In-line Fabry-Perot interferometer with high-reflectance internal mirrors,” J. Lightwave Technol. 10, 1376-1379 (1992).
-
(1992)
J. Lightwave Technol.
, vol.10
, pp. 1376-1379
-
-
Lee, C.E.1
Gibler, W.N.2
Atkins, R.A.3
Taylor, H.F.4
-
16
-
-
18444386754
-
Jr “Scanning differential interferometer to measure index heterogenity,”
-
N. Bobroff, A. E. Rosenbluth, and M. Hatzakis, Jr., “Scanning differential interferometer to measure index heterogenity,” Appl. Opt. 31, 6622-6631 (1992).
-
(1992)
Appl. Opt
, vol.31
, pp. 6622-6631
-
-
Bobroff, N.1
Rosenbluth, A.E.2
Hatzakis, M.3
-
17
-
-
85010179516
-
Signal measurements of multi-layer refractive write once data storage media
-
D. B. Carlin and D. B. Kay, eds., Proc. SPIE
-
J. H. Strickler and W. W. Webb, “Signal measurements of multi-layer refractive write once data storage media,” in Optical Data Storage, D. B. Carlin and D. B. Kay, eds., Proc. SPIE 1663, 104-111 (1992).
-
(1992)
Optical Data Storage
, vol.1663
, pp. 104-111
-
-
Strickler, J.H.1
Webb, W.W.2
-
18
-
-
0027905474
-
Nondestructive evaluation of solids and deposited films by thermal-wave interferometry
-
E. Oesterschulze, M. Stopka, M. Trochtrop-Mayr, K. Masseli, and R. Kassing, “Nondestructive evaluation of solids and deposited films by thermal-wave interferometry,” Appl. Surf. Sci. 69, 65-68 (1993).
-
(1993)
Appl. Surf. Sci.
, vol.69
, pp. 65-68
-
-
Oesterschulze, E.1
Stopka, M.2
Trochtrop-Mayr, M.3
Masseli, K.4
Kassing, R.5
-
19
-
-
36449000271
-
Noncontacting measurement of opaque thin films using a dual beam thermal-wave probe
-
M. B. Suddendorf, M. Liu, and M. G. Somekh, “Noncontacting measurement of opaque thin films using a dual beam thermal-wave probe,” Appl. Phys. Lett. 62, 3256-3258 (1993).
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 3256-3258
-
-
Suddendorf, M.B.1
Liu, M.2
Somekh, M.G.3
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