Grazing incidence reflectivity and total electron yield effects in soft x-ray absorption spectroscopy

Journal of Engineering and Applied Science

Volumn 82, Issue 6, 1997, Pages 3120-3124

  Alders, D ^a   Hibma, T ^a   Sawatzky, G A ^a   Cheung, K C ^a   van Dorssen, G E ^a   Roper, M D ^a   Padmore, H A ^a   van der Laan, G ^a   Vogel, J ^a   Sacchi, M ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRONS; LIGHT POLARIZATION; MATHEMATICAL MODELS; NICKEL COMPOUNDS; PHOTODIODES; REFRACTIVE INDEX;

GRAZING INCIDENCE REFLECTIVITY; X RAY ABSORPTION SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 0031238141     PISSN: 11101903     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)