A spherical capacitive probe for measuring the thickness of coatings on metals

Measurement Science and Technology

Volumn 8, Issue 9, 1997, Pages 1028-1033

  Zhang, Ren Jie ^a   Dai, Shu Guang ^a   Mu, Ping An ^a  

^a UNIVERSITY OF SHANGHAI FOR SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; MATHEMATICAL MODELS; NETWORKS (CIRCUITS); PROBES;

SPHERICAL CAPACITIVE PROBES;

THICKNESS MEASUREMENT;

EID: 0031237529     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/8/9/012     Document Type: Article

References (2)

1. 1982 ISO 2178 The measure standard for measuring the thickness of non-magnetic coating on magnetic metal base
2. 1982 ISO 2360 The eddy method - the thickness measurement of non-conducting coating on non-magnetic metal base