Photovoltammetry and surface analysis of MoSe2 thin films prepared by an intercalation-exfoliation method

Journal of the Electrochemical Society

Volumn 144, Issue 9, 1997, Pages 3135-3140

  Castro, Raúl J ^a,b   Cabrera, Carlos R ^a  

^a Materials Research Center   (Puerto Rico)

^b UNIVERSITY OF PUERTO RICO AT CAYEY   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CYCLIC VOLTAMMETRY; ELECTROCHEMICAL ELECTRODES; ELECTRON SPECTROSCOPY; MOLYBDENUM COMPOUNDS; MORPHOLOGY; OXIDATION; REDUCTION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS; INTERCALATION EXFOLIATION METHOD; PHOTOVOLTAMMETRY;

FILM PREPARATION;

EID: 0031237490     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1837971     Document Type: Article

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