Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscope

Applied Physics Letters

Volumn 71, Issue 9, 1997, Pages 1270-1272

  Wong, W K ^a   Phang, J C H ^a   Thong, J T L ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRIC INSULATORS; ELECTRIC VARIABLES MEASUREMENT; ELECTROSTATIC DEVICES; MIRRORS; SCANNING ELECTRON MICROSCOPY;

CURRENT EQUILIBRIUM POINT; ELECTROSTATIC MIRROR; GLASS PASSIVATION; SECONDARY EMISSION CROSSOVER;

ELECTRON EMISSION;

EID: 0031237187     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119870     Document Type: Article

References (12)

1. J. Pawley, J. Microsc. 136, 45 (1984).
2. D. C. Joy, Scanning 11, 1 (1989); J. Microsc. 136, 241 (1984); 147, 51 (1987).
3. D. C. Joy, Scanning 11, 1 (1989); J. Microsc. 136, 241 (1984); 147, 51 (1987).
4. D. C. Joy, Scanning 11, 1 (1989); J. Microsc. 136, 241 (1984); 147, 51 (1987).
5. P. Girard, P. Charpenel, and H. Martin, J. Appl. Phys. 71, 2871 (1992).
6. M. Brunner and E. Menzel, J. Vac. Sci. Technol. B 1, 1344 (1983).
7. J. P. Vigouroux, J. P. Duraud, A. LeMoel, and C. Le Gressus, J. Appl. Phys. 57, 5139 (1985).
8. C. Le Gressus, F. Valin, M. Henriot, M. Gautier, J. P. Duraud, T. S. Sudarshan, R. G. Bommakanti, and G. Blaise, J. Appl. Phys. 69, 6325 (1991).
9. J. P. Vigouroux, J. P. Duraud, A. LeMoel, C. Le Gressus, and C. Boiziau, Nucl. Instrum. Methods Phys. Res. B 1, 521 (1984).
10. W. K. Wong, Scanning Microscopy Conference, Chicago, IL, 1997 (unpublished).
11. J. H. Butler, D. C. Joy, G. F. Bradley, and S. J. Krause, Polymer 36, 1787 (1995).
12. H. Sugiyama, S. Ikeda, and Y. Uchikawa, Electron. Microsc. 35, 9 (1986).