Preparation and x-ray pole-figure characterization of DC-sputtered Bi-2201, Bi-2212 and Bi-2223 thin films

Superconductor Science and Technology

Volumn 10, Issue 9, 1997, Pages 712-716

  Holiastou, M ^a   Psyharis, V ^a   Niarchos, D ^a   Haibach, P ^b   Frey, U ^b   Adrian, H ^b  

^a INSTITUTE OF MATERIALS SCIENCE   (Greece)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; DIFFRACTOMETERS; EPITAXIAL GROWTH; FILM PREPARATION; MAGNETIC PERMEABILITY MEASUREMENT; OXIDE SUPERCONDUCTORS; SPUTTERING; SUPERCONDUCTING TRANSITION TEMPERATURE; X RAY ANALYSIS;

DIODE SPUTTERING; X RAY POLE FIGURE CHARACTERIZATION;

SUPERCONDUCTING FILMS;

EID: 0031236640     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/10/9/012     Document Type: Article

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