X-ray photoelectron spectroscopic and atomic force microscopic studies of pyrolytically coated graphite and highly oriented pyrolytic graphite used for electrothermal vaporization

Journal of Analytical Atomic Spectrometry

Volumn 12, Issue 9, 1997, Pages 951-955

  Galbács, Gábor ^a   Sneider, János ^a   Oszkó, Albert ^a   Vanhaecke, Frank ^b   Moens, Luc ^b  

^a UNIVERSITY OF SZEGED   (Hungary)

^b GHENT UNIVERSITY   (Belgium)

Author keywords

Atomic force microscopy; Depth profiling; Electrothermal vaporization; Highly oriented pyrolytic graphite; Pyrolytically coated graphite; Solid sample; X ray photoelectron spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; ETCHING; SODIUM COMPOUNDS; VAPORIZATION; X RAY PHOTOELECTRON SPECTROSCOPY;

DEPTH PROFILING; ELECTROTHERMAL VAPORIZATION;

GRAPHITE;

EID: 0031236118     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/A701979C     Document Type: Article

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