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Volumn 30, Issue 18, 1997, Pages 2503-2508
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The influence of imaging conditions on the appearance of lattice-resolved AFM images of mica surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
DISTORTION (WAVES);
FRICTION;
IMAGING TECHNIQUES;
INTERFACES (MATERIALS);
MICA;
SURFACE MEASUREMENT;
SURFACE PHENOMENA;
DIRECTION DEPENDENT FRICTIONAL FORCES;
FORCE CONTRAST;
IMAGING LIQUID;
TIP SURFACE INTERACTIONS;
ATOMIC FORCE MICROSCOPY;
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EID: 0031235855
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/30/18/002 Document Type: Article |
Times cited : (7)
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References (27)
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