Comparison of transmission electron microscopy and optical microstructures in Al-1% Mg after plane strain compression

Journal of Materials Science

Volumn 32, Issue 17, 1997, Pages 4591-4594

  Baxter, G J ^a   Whiteman, J A ^a   Sellars, C M ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM FOIL; COMPRESSION TESTING; DEFORMATION; HOT ROLLING; METALLOGRAPHIC MICROSTRUCTURE; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; STRAIN; TRANSMISSION ELECTRON MICROSCOPY;

PLANE STRAIN COMPRESSION TESTS;

ALUMINUM ALLOYS;

EID: 0031235749     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018681519849     Document Type: Article

References (13)

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