Three-dimensional measurement of macro- and microdomains using optical methods

Optics and Lasers in Engineering

Volumn 28, Issue 1, 1997, Pages 1-16

  Leopold, J ^a   Hertwig, M ^b   Gunther H ^a   Staeger, B ^b  

^a Soc for Prod Eng and Development   (Germany)

^b ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CONTOUR MEASUREMENT; INTERFEROMETRY; MORPHOLOGY; SPECKLE;

ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI);

SURFACE STRUCTURE;

EID: 0031235417     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(97)00012-2     Document Type: Article

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