Determination of modified embedded atom method parameters for nickel

Materials Chemistry and Physics

Volumn 50, Issue 2, 1997, Pages 152-158

  Baskes, M I ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Embedded atom method; Interatomic potentials; Intrinsic defects; Nickel; Simulation; Surfaces

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; SURFACES; THERMAL EXPANSION;

INTERSTITIAL MIGRATION; MODIFIED EMBEDDED ATOM METHOD (MEAM); SURFACE RECONSTRUCTION;

NICKEL;

EID: 0031235393     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(97)80252-0     Document Type: Article

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