Inspection for circuit board assembly

Management Science

Volumn 43, Issue 9, 1997, Pages 1198-1213

  Chevalier, Phillipe B ^a   Wein, Lawrence M ^a  

^a NONE

Author keywords

Electronics Manufacturing; Inspection Decisions; Quality Control

Indexed keywords

COST EFFECTIVENESS; INSPECTION; OPTIMIZATION; PROBLEM SOLVING; QUALITY CONTROL;

INSPECTION ALLOCATION PROBLEM;

PRINTED CIRCUIT MANUFACTURE;

EID: 0031234624     PISSN: 00251909     EISSN: None     Source Type: Journal    
DOI: 10.1287/mnsc.43.9.1198     Document Type: Article

References (11)

1. Chevalier, P. B., "Two Topics in Multistage Manufacturing Systems," Doctoral Dissertation, Operations Research Center, MIT, Cambridge, MA, 1992.
2. Chevalier, P. B. and L. M. Wein, "Inspection for Circuit Board Assembly," Working Paper, Operations Research Center, MIT, Cambridge, MA, 1994.
3. Duncan, A. J., Quality Control and Industrial Statistics, Irwin, Home-wood, IL, 1986.
4. Eppen, G. D. and E. G. Hurst, "Optimal Allocation of Inspection Stations in a Multistage Production Process," Management Sci., 20 (1974), 1194-1200.
5. Garcia-Diaz, A., J. W. Foster, and M. Bonyuet, "Dynamic Programming Analysis of Special Multistage Inspection Systems," IIE Trans., 16 (1984), 115-125.
6. Lindsay, G. F. and A. B. Bishop, "Allocation of Screening Inspection Effort - A Dynamic-Programming Approach," Management Sci., 10 (1967), 342-352.
7. Raz, T., "A Survey of Models for Allocating Inspection Effort in Multistage Production Systems," J. Quality Technology, 18 (1986), 239-247.
8. Tang, C. S., "Designing an Optimal Production System with Inspection," European J. Oper. Res., 52 (1991), 45-54.
9. Villalobos, J. R., J. W. Foster, and R. L. Disney, "Flexible Inspection Systems for Serial Multi-Stage Production Systems," Working Paper, Department of Industrial Engineering, Texas A&M University, College Station, TX, 1992.
10. White, L. S., "The Analysis of a Simple Class of Multistage Inspection Plans," Management Sci., 9 (1966), 685-693.
11. Yum, B. J. and E. D. McDowell, "The Optimal Allocation of Inspection Effort in a Class of Nonserial Production Systems," IIE Trans., 13 (1981), 285-293.