Study of 1/f noise in hydrogenated amorphous silicon thin films

Solid-State Electronics

Volumn 41, Issue 9, 1997, Pages 1247-1249

  Ho, W Y ^a   Surya, Charles ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ANNEALING; CHARGE CARRIERS; COOLING; ELECTRIC RESISTANCE; TEMPERATURE; THIN FILMS;

ARRHENIUS PLOTS; RESISTIVE DEVICES; THERMAL EQUILIBRATION PROCESS; VOLTAGE NOISE POWER SPECTRA;

SPURIOUS SIGNAL NOISE;

EID: 0031234550     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(97)00073-7     Document Type: Article

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