Estimation of kinetic properties of particles forming random rough surfaces

Solid State Communications

Volumn 103, Issue 10, 1997, Pages 555-558

  Palasantzas, G ^a   Geerligs, L J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

A. surfaces and interfaces; A. thin films; C. scanning tunnelling microscopy

Indexed keywords

ACTIVATION ENERGY; CORRELATION METHODS; DIFFUSION IN SOLIDS; FUNCTIONS; INTERFACES (MATERIALS); MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SENSITIVITY ANALYSIS; SURFACE ROUGHNESS; THIN FILMS;

KINETIC PROPERTIES ESTIMATION;

PARTICLES (PARTICULATE MATTER);

EID: 0031234083     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(97)00248-2     Document Type: Article

References (27)

1. Krim, J. and Palasantzas, G., Int. J. Mod. Phys., B9, 1995, 599.
2. Family, F. and Viscek, T., Dynamics of Fractal Surfaces. World Scientific, 1991; Meakin, P., Phys. Reports, 235, 1993, 189.
3. Family, F. and Viscek, T., Dynamics of Fractal Surfaces. World Scientific, 1991; Meakin, P., Phys. Reports, 235, 1993, 189.
4. Mandelbrodt, B.B., The Fractal Geometry of Nature. Freeman, New York, 1982.
5. Palasantzas, G., Phys. Rev., E49, 1994, 1740; Krim, J. and Indekeu, J.O., Phys. Rev., E48, 1993, 1576.
6. Palasantzas, G., Phys. Rev., E49, 1994, 1740; Krim, J. and Indekeu, J.O., Phys. Rev., E48, 1993, 1576.
7. Tringides, M.C., Proc. MRS, 280, 1993, 47.
8. Egelhof, W.F. and Jacob, I., Phys. Rev. Lett., 62, 1989, 921.
9. 1/2.5.
10. Villain, J., J. Phys. I., 1, 1991, 19.
11. Yang, H.-N., Lu, T.-M. and Wang, G.-C., Phys. Rev. Lett., 68, 1992, 2612.
12. 2 if R ≫ ξ.
13. 2 if R ≫ ξ.
14. Wolf, D.E. et al., Europhys. Lett., 13, 1990, 389; Lai, Z.W. et al., Phys. Rev. Lett., 66, 1991, 2348; Tang, L.-H. et al., Phys. Rev. Lett., 66, 1991, 2899; Siegert, M. et al., Phys. Rev. Lett., 68, 1992, 2035.
15. Wolf, D.E. et al., Europhys. Lett., 13, 1990, 389; Lai, Z.W. et al., Phys. Rev. Lett., 66, 1991, 2348; Tang, L.-H. et al., Phys. Rev. Lett., 66, 1991, 2899; Siegert, M. et al., Phys. Rev. Lett., 68, 1992, 2035.
16. Wolf, D.E. et al., Europhys. Lett., 13, 1990, 389; Lai, Z.W. et al., Phys. Rev. Lett., 66, 1991, 2348; Tang, L.-H. et al., Phys. Rev. Lett., 66, 1991, 2899; Siegert, M. et al., Phys. Rev. Lett., 68, 1992, 2035.
17. Wolf, D.E. et al., Europhys. Lett., 13, 1990, 389; Lai, Z.W. et al., Phys. Rev. Lett., 66, 1991, 2348; Tang, L.-H. et al., Phys. Rev. Lett., 66, 1991, 2899; Siegert, M. et al., Phys. Rev. Lett., 68, 1992, 2035.
18. Shitara, T., Suzuki, T., Vvedensky, D.D. and Nishinaga, T., Proc. MRS, 280, 1993, 131; Yan, Y., Proc. MRS, 280, 1993, 289; Yan, Y., Phys. Rev. Lett., 68, 1992, 3048.
19. Shitara, T., Suzuki, T., Vvedensky, D.D. and Nishinaga, T., Proc. MRS, 280, 1993, 131; Yan, Y., Proc. MRS, 280, 1993, 289; Yan, Y., Phys. Rev. Lett., 68, 1992, 3048.
20. Shitara, T., Suzuki, T., Vvedensky, D.D. and Nishinaga, T., Proc. MRS, 280, 1993, 131; Yan, Y., Proc. MRS, 280, 1993, 289; Yan, Y., Phys. Rev. Lett., 68, 1992, 3048.
21. Haider, N., Wilby, M.R. and Vvedensky, D.D., Proc. MRS, 280, 1993, 135.
22. Stoyanov, S. and Kashchiev, D., in Current Topics in Materials Science, Vol. 7, (Edited by Kaldis). North Holland, Amsterdam, 1981; Venables, J.A. et al., Rep. Prog. Phys., 47, 1994, 399; Villain, J. et al., J. Phys. I (France), 2, 1992, 2107; Villain, J. et al., Comments Cond. Mat Phys., 16, 1992, 1.
23. Stoyanov, S. and Kashchiev, D., in Current Topics in Materials Science, Vol. 7, (Edited by Kaldis). North Holland, Amsterdam, 1981; Venables, J.A. et al., Rep. Prog. Phys., 47, 1994, 399; Villain, J. et al., J. Phys. I (France), 2, 1992, 2107; Villain, J. et al., Comments Cond. Mat Phys., 16, 1992, 1.
24. Stoyanov, S. and Kashchiev, D., in Current Topics in Materials Science, Vol. 7, (Edited by Kaldis). North Holland, Amsterdam, 1981; Venables, J.A. et al., Rep. Prog. Phys., 47, 1994, 399; Villain, J. et al., J. Phys. I (France), 2, 1992, 2107; Villain, J. et al., Comments Cond. Mat Phys., 16, 1992, 1.
25. Stoyanov, S. and Kashchiev, D., in Current Topics in Materials Science, Vol. 7, (Edited by Kaldis). North Holland, Amsterdam, 1981; Venables, J.A. et al., Rep. Prog. Phys., 47, 1994, 399; Villain, J. et al., J. Phys. I (France), 2, 1992, 2107; Villain, J. et al., Comments Cond. Mat Phys., 16, 1992, 1.
26. Metcalfe, F.L. and Venables, J.A., Proc. MRS, 280, 1992, 55.
27. Luo, E.Z., Wollschlager, J., Wegner, F. and Henzler, M., Appl. Phys., A60, 1995, 19.