-
4
-
-
0019592219
-
Statistical design centering and tolerancing using parametric sampling
-
July
-
K. Singhal and J. F. Pinel, "Statistical design centering and tolerancing using parametric sampling." IEEE Trans. Circuits and Syst. CAS-28(7), pp. 692-702, July 1981.
-
(1981)
IEEE Trans. Circuits and Syst
, vol.CAS-28
, Issue.7
, pp. 692-702
-
-
Singhal, K.1
Pinel, J.F.2
-
5
-
-
0020778410
-
A study of variance reduction techniques for estimating circuit yields
-
July
-
D. E. Hocevar, M. R. Lightner, and T. N. Trick, "A study of variance reduction techniques for estimating circuit yields." IEEE Trans. Computer-Aided Design CAD-2(3), pp. 180-192, July 1983.
-
(1983)
IEEE Trans. Computer-Aided Design
, vol.CAD-2
, Issue.3
, pp. 180-192
-
-
Hocevar, D.E.1
Lightner, M.R.2
Trick, T.N.3
-
7
-
-
0022112161
-
Efficient tolerance analysis using control variates
-
August
-
R. S. Soin and P. J. Rankin, "Efficient tolerance analysis using control variates." IEE Proc. 132, Pt. G(4), pp. 131-142, August 1985.
-
(1985)
IEE Proc.
, vol.132
, Issue.4 PART G
, pp. 131-142
-
-
Soin, R.S.1
Rankin, P.J.2
-
8
-
-
0022583166
-
An efficient method of sampling for statistical circuit design
-
January
-
M. L. Stein, "An efficient method of sampling for statistical circuit design." IEEE Trans. Computer-Aided Design CAD-5(1), pp. 23-29, January 1986.
-
(1986)
IEEE Trans. Computer-Aided Design
, vol.CAD-5
, Issue.1
, pp. 23-29
-
-
Stein, M.L.1
-
9
-
-
2342483583
-
Monte Carlo based yield maximization with a quadratic model
-
New Port Beach, CA
-
D. E. Hocevar, M. R. Lightner, and T. N. Trick, "Monte Carlo based yield maximization with a quadratic model," in Proc. IEEE Int. Symp. Circuits and Systems, New Port Beach, CA, 1983, pp. 550-553.
-
(1983)
Proc. IEEE Int. Symp. Circuits and Systems
, pp. 550-553
-
-
Hocevar, D.E.1
Lightner, M.R.2
Trick, T.N.3
-
10
-
-
0018720571
-
Efficiency of yield estimation by the Monte Carlo methods
-
Sussex, England, July
-
M. A. Styblinski, "Efficiency of yield estimation by the Monte Carlo methods," in Int. Conf. Computer-Aided Design Manufacture Electronic Components Circuits Syst., Sussex, England, July 1979, pp. 150-153.
-
(1979)
Int. Conf. Computer-Aided Design Manufacture Electronic Components Circuits Syst.
, pp. 150-153
-
-
Styblinski, M.A.1
-
11
-
-
0018468345
-
A comparison of three methods for selecting values of input variables in analysis of output from a computer code
-
May
-
M. D. McKay, R. J. Beckman, and W. J. Conover, "A comparison of three methods for selecting values of input variables in analysis of output from a computer code." Technometrics 21(2), pp. 239-245, May 1979.
-
(1979)
Technometrics
, vol.21
, Issue.2
, pp. 239-245
-
-
McKay, M.D.1
Beckman, R.J.2
Conover, W.J.3
-
13
-
-
49949126152
-
Probability measures of fuzzy events
-
L. A. Zadeh, "Probability measures of fuzzy events." J. Math. Anal. Apl. 23, pp. 421-427, 1968.
-
(1968)
J. Math. Anal. Apl.
, vol.23
, pp. 421-427
-
-
Zadeh, L.A.1
-
14
-
-
84870042024
-
Optimization of parametric yield: A tutorial
-
S. W. Director, P. Feldmann, and K. Krishna, "Optimization of parametric yield: a tutorial," in Proc. IEEE Custom Integrated Circuits Conference, 1992, pp. 3.1.1-3.1.8.
-
(1992)
Proc. IEEE Custom Integrated Circuits Conference
, pp. 311-318
-
-
Director, S.W.1
Feldmann, P.2
Krishna, K.3
-
15
-
-
84945715056
-
Statistical modeling for efficient parametric yield estimation of MOS VLSI circuits
-
February
-
P. Cox, P. Yang, S. S. Mahant-Shetti, and P. Chatterjee, "Statistical modeling for efficient parametric yield estimation of MOS VLSI circuits." IEEE Trans. Electron Devices ED-32(2), pp. 471-478, February 1985.
-
(1985)
IEEE Trans. Electron Devices
, vol.ED-32
, Issue.2
, pp. 471-478
-
-
Cox, P.1
Yang, P.2
Mahant-Shetti, S.S.3
Chatterjee, P.4
-
16
-
-
0003663467
-
-
McGraw-Hill, Inc.
-
A. Papoulis, Probability, Random Variables, and Stochastic Process. Third edition, McGraw-Hill, Inc., 1991.
-
(1991)
Probability, Random Variables, and Stochastic Process. Third Edition
-
-
Papoulis, A.1
-
18
-
-
0009076182
-
Generalized quota sampling
-
H. A. Steinberg, "Generalized quota sampling," Nuc. Sci. and Engr. 15, pp. 142-145, 1963.
-
(1963)
Nuc. Sci. and Engr.
, vol.15
, pp. 142-145
-
-
Steinberg, H.A.1
-
19
-
-
0004216005
-
-
McGraw-Hill: New York
-
Raj and Des, Sampling Theory. McGraw-Hill: New York, 1968.
-
(1968)
Sampling Theory
-
-
Raj1
Des2
-
20
-
-
84900847494
-
Small sample sensitivity analysis technique for computer models, with an application to risk assessment
-
R. L. Iman and W. J. Conover, "Small sample sensitivity analysis technique for computer models, with an application to risk assessment." Communications in Statistics A9-(17), pp. 1749-1874, 1980.
-
(1980)
Communications in Statistics
, vol.A9
, Issue.17
, pp. 1749-1874
-
-
Iman, R.L.1
Conover, W.J.2
-
21
-
-
84933516758
-
A distribution-free approach to inducing rank correlation among input variables
-
R. L. Iman and W. J. Conover, "A distribution-free approach to inducing rank correlation among input variables." Communications in Statistics Simula. Computa. B11-(3), pp. 311-334, 1982.
-
(1982)
Communications in Statistics Simula. Computa.
, vol.B11
, Issue.3
, pp. 311-334
-
-
Iman, R.L.1
Conover, W.J.2
-
22
-
-
0023822856
-
An investigation of uncertainty and sensivity analysis techniques for computer models
-
R. L. Iman and J. C. Helton, "An investigation of uncertainty and sensivity analysis techniques for computer models." Risk Analysis 8(1), pp. 71-90, 1988.
-
(1988)
Risk Analysis
, vol.8
, Issue.1
, pp. 71-90
-
-
Iman, R.L.1
Helton, J.C.2
-
23
-
-
0026256867
-
Parametric yield optimization of CMOS analog circuits by quadratic stochastic circuit performance models
-
T. K. Yu and S. M. Kang, "Parametric yield optimization of CMOS analog circuits by quadratic stochastic circuit performance models." Int. Journal of Circuit Theory and Applications 19, pp. 579-592, 1991.
-
(1991)
Int. Journal of Circuit Theory and Applications
, vol.19
, pp. 579-592
-
-
Yu, T.K.1
Kang, S.M.2
-
25
-
-
0026839811
-
Integrated circuit design optimization using a sequential strategy
-
March
-
M. C. Bernardo, R. Buck, L. Liu, W. A. Nazaret, J. Sacks, and W. J. Welch, "Integrated circuit design optimization using a sequential strategy." IEEE Trans. Computer-Aided Design 11(3), pp. 361-372, March 1992.
-
(1992)
IEEE Trans. Computer-Aided Design
, vol.11
, Issue.3
, pp. 361-372
-
-
Bernardo, M.C.1
Buck, R.2
Liu, L.3
Nazaret, W.A.4
Sacks, J.5
Welch, W.J.6
-
26
-
-
0027695165
-
Combination of interpolation and self-organizing approximation techniques- a new approach to circuit performance modeling
-
November
-
M. A. Styblinski and Syed Aftab, "Combination of interpolation and self-organizing approximation techniques- a new approach to circuit performance modeling." IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems 12(11), pp. 1775-1785, November 1993.
-
(1993)
IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems
, vol.12
, Issue.11
, pp. 1775-1785
-
-
Styblinski, M.A.1
Aftab, S.2
-
27
-
-
2342525105
-
Theoretical bases of Latin hypercube sampling Monte Carlo (LHSMC) estimators for statistical circuit design
-
Ecole Superieure d'Electricite (SUPELEC), Paris, France, June
-
M. Keramat, "Theoretical bases of Latin hypercube sampling Monte Carlo (LHSMC) estimators for statistical circuit design." Ecole Superieure d'Electricite (SUPELEC), Paris, France, Tech. Rep. No. SUP-0696-11, June 1996.
-
(1996)
Tech. Rep. No. SUP-0696-11
-
-
Keramat, M.1
-
28
-
-
84945715056
-
Statistical modeling for efficient parametric yield estimation of MOS VLSI circuits
-
February
-
P. Cox, P. Yang, S. S. Mahant-Shetti, and P. Chatterjee, "Statistical modeling for efficient parametric yield estimation of MOS VLSI circuits." IEEE Trans. Electron Devices ED-32(2), pp. 471-478, February 1985.
-
(1985)
IEEE Trans. Electron Devices
, vol.ED-32
, Issue.2
, pp. 471-478
-
-
Cox, P.1
Yang, P.2
Mahant-Shetti, S.S.3
Chatterjee, P.4
-
29
-
-
0022562544
-
An integrated and efficient approach for MOS VLSI statistical circuit design
-
January
-
P. Yang, D. E. Hocevar, P. F. Cox, C. Machala, and P. K. Chatterjee, "An integrated and efficient approach for MOS VLSI statistical circuit design." IEEE Trans. on Computer-Aided Design CAD-5(1), pp. 5-14, January 1986.
-
(1986)
IEEE Trans. on Computer-Aided Design
, vol.CAD-5
, Issue.1
, pp. 5-14
-
-
Yang, P.1
Hocevar, D.E.2
Cox, P.F.3
Machala, C.4
Chatterjee, P.K.5
-
30
-
-
0024029576
-
Parametric yield optimization for MOS circuit blocks
-
June
-
D. E. Hocevar, P. F. Cox, and P. Yang, "Parametric yield optimization for MOS circuit blocks." IEEE Trans. Computer-Aided Design 7(6), pp. 645-658, June 1988.
-
(1988)
IEEE Trans. Computer-Aided Design
, vol.7
, Issue.6
, pp. 645-658
-
-
Hocevar, D.E.1
Cox, P.F.2
Yang, P.3
-
31
-
-
0015401499
-
Tolerance assignment in linear network using nonlinear programming
-
September
-
J. F. Pinel and K. A. Roberts, "Tolerance assignment in linear network using nonlinear programming." IEEE Trans. Circuit Theory 19(5), pp. 475-479, September 1972.
-
(1972)
IEEE Trans. Circuit Theory
, vol.19
, Issue.5
, pp. 475-479
-
-
Pinel, J.F.1
Roberts, K.A.2
-
32
-
-
2342654289
-
OMEGA: Open electrical circuit simulation system, user's manual, version 6.0
-
Ecole Superieure d'Electricite (SUPELEC), Paris, France, September
-
P. Aldebert and R. Klielbasa, "OMEGA: open electrical circuit simulation system, user's manual, version 6.0," Ecole Superieure d'Electricite (SUPELEC), Paris, France, Tech. Rep., September 1993.
-
(1993)
Tech. Rep.
-
-
Aldebert, P.1
Klielbasa, R.2
-
34
-
-
0345359004
-
Using Matlab in interprocess communications
-
Ecole Superieure d'Electricite (SUPELEC), Paris, France, April
-
M. Keramat, "Using Matlab in interprocess communications," Ecole Superieure d'Electricite (SUPELEC), Paris, France, Tech. Rep. No. SUP-0496-7, April 1996.
-
(1996)
Tech. Rep. No. SUP-0496-7
-
-
Keramat, M.1
|