Large-field high-resolution x-ray microscope for studying laser plasmas

Review of Scientific Instruments

Volumn 68, Issue 9, 1997, Pages 3412-3420

  Sauneuf, Richard ^a   Dalmasso, Jean Michel ^a   Jalinaud, Thierry ^a   Le Breton, Jean Pierre ^a   Schirmann, Daniel ^b   Marioge, Jean Paul ^c   Bridou, Françoise ^c   Tissot, Gérard ^c   Clotaire, Jean Yves ^c  

^a DIF   (France)

^b Commsrt l'Ener Atom/B ^*  (France)

^c INSTITUT D'OPTIQUE GRADUATE SCHOOL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; MIRRORS; OPTICAL SYSTEMS; OPTICS; X RAY MICROSCOPES;

FIELD OBLIQUITY; MAGNIFICATION; PINHOLE; X RAY DIAGNOSTICS; X RAY SOURCES;

LASER PRODUCED PLASMAS;

EID: 0031232960     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148302     Document Type: Article

References (5)

1. P. Kirkpatrick and A. V. Baez, J. Opt. Soc. Am. 38, 766 (1948).
2. F. Seward, J. Dent, M. Boyle, L. Koppel, T. Harper, P. Stoering, and A. Toor, Rev. Sci. Instrum. 47, 464 (1976).
3. J. Dyson, Proc. Phys. Soc. London, Sect. B 65, 580 (1952).
4. R. H. Price and M. J. Boyle, LLNL Laser Program Annual Report 1978 (UCRL-50021-78), pp. 6.14-6.23.
5. B. L. Henke and M. A. Tester, Advances in X-ray Analysis (Plenum, New York, 1975), Vol. 18, pp. 76-106.