Low temperature characterization of silicon CMOS devices

Microelectronics Reliability

Volumn 37, Issue 9, 1997, Pages 1353-1366

  Ghibaudo, G ^a   Balestra, F ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HOT CARRIERS; IONIZATION OF SOLIDS; LEAKAGE CURRENTS; LOW TEMPERATURE OPERATIONS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS;

CARRIER MOBILITY LAW; SATURATION VELOCITY;

CMOS INTEGRATED CIRCUITS;

EID: 0031232505     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(97)00007-3     Document Type: Article

References (13)

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