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Volumn 289, Issue 1-2, 1997, Pages 131-136

Study of dielectric relaxation behavior in Nd2CuO4

Author keywords

Dielectric

Indexed keywords

ACTIVATION ENERGY; ANNEALING; CAPACITANCE MEASUREMENT; DIELECTRIC RELAXATION; HELIUM; HIGH TEMPERATURE EFFECTS; LOW TEMPERATURE EFFECTS; NEODYMIUM COMPOUNDS; PERMITTIVITY;

EID: 0031224625     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)01577-3     Document Type: Article
Times cited : (41)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.