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Volumn 33, Issue 5 PART 1, 1997, Pages 2905-2907
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Design, fabrication, and wafer level testing of (NiFe/Cu)xn dual stripe GMR sensors
f
SIEMENS AG
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
COPPER;
MAGNETIC RECORDING;
MAGNETORESISTANCE;
MATHEMATICAL MODELS;
METALLIC SUPERLATTICES;
NICKEL ALLOYS;
SENSORS;
DUAL STRIPE MAGNETORESISTIVE RECORDING (DSMR) HEADS;
GIANT MONOPOLE RESONANCE (GMR);
MAGNETIC HEADS;
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EID: 0031224536
PISSN: 00189464
EISSN: None
Source Type: Journal
DOI: 10.1109/20.617793 Document Type: Article |
Times cited : (12)
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References (6)
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