Recording studies of sub-micron write heads by focused ion beam trimming

IEEE Transactions on Magnetics

Volumn 33, Issue 5 PART 1, 1997, Pages 2824-2826

  German, Grace L ^a   Vo, Lang ^b   Hu, Ben H L ^a   Tsang, Ching ^b   Cser, Jim ^a   Lindquist, Jay ^b  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b EI Company   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ION BEAMS; LITHOGRAPHY; MAGNETIC RECORDING;

FOCUSED ION BEAM (FIB) TRIMMING; INDUCTIVE WRITE HEADS;

MAGNETIC HEADS;

EID: 0031223333     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.617744     Document Type: Article

References (6)

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2. C. Tsang, H. Santini, D. McCown, J. Lo and R. Lee, "3 Gb/in.2 Recording Demonstration With Dual Element Heads & Thin Film Disks," IEEE Trans. Magn., vol. 32, pp. 7-12, 1996.
3. H. Takano, H. Fukuoka, M. Suzuki, K. Shiiki, M. Kitada, "Submicron-Trackwidth Inductive/MR Composite Head," IEEE Trans. Uaf . vol 27, pp. 4678-4683. 1001
4. W.P. Jayasekara, S. Wang, M. H. Kryder, "Narrow track MR head technology," J. Appl. Phys., vol. 79, pp. 5880-5882, 1996.
5. J.A. Brug, T. C. Anthony, J. H. Nickel, "Magnetic Recording Head Materials," MRS Bull, sept. pp. 23-27, 1996.
6. M.H. Kryder, W. Messner, L. R. Carey, "Approaches to 10 Gbit/in.2 Recording," J. Appl. Phys., vol. 79, pp. 4485-4490, 1996.