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Volumn 36, Issue 9 A/B, 1997, Pages

Two-dimensional hydrogen analysis by time-of-flight-type electron-stimulated desorption spectroscopy

Author keywords

ESD; Hydrogen; Scanning image of hydrogen; Silicon oxide; TOF

Indexed keywords

IMAGING TECHNIQUES; SILICON COMPOUNDS; SPECTROSCOPIC ANALYSIS;

SCANNING ELECTRON STIMULATED DESORPTION SPECTROSCOPY (ESD); SILICON OXIDE; TWO DIMENSIONAL HYDROGEN ANALYSIS;

HYDROGEN;

EID: 0031223252 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.36.l1254 Document Type: Article

Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.