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Volumn 36, Issue 9 A/B, 1997, Pages

Lattice distortion of macrocrystalline cubic boron nitride measured by X-ray diffraction

Author keywords

Bias sputtering; Compressive stress; Cubic boron nitride; Film; X ray diffraction

Indexed keywords

CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; FILMS; RESIDUAL STRESSES; SPUTTERING; STRESS ANALYSIS; SYNTHESIS (CHEMICAL); X RAY CRYSTALLOGRAPHY;

EID: 0031223251     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.l1236     Document Type: Article
Times cited : (4)

References (21)
  • 2
    • 5544319766 scopus 로고    scopus 로고
    • R. C. DeVries: GE CRD Report No. 72CRD178, 1972
    • R. C. DeVries: GE CRD Report No. 72CRD178, 1972.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.