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Volumn 36, Issue 9 A/B, 1997, Pages
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Lattice distortion of macrocrystalline cubic boron nitride measured by X-ray diffraction
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Author keywords
Bias sputtering; Compressive stress; Cubic boron nitride; Film; X ray diffraction
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Indexed keywords
CRYSTAL DEFECTS;
CRYSTALLINE MATERIALS;
FILMS;
RESIDUAL STRESSES;
SPUTTERING;
STRESS ANALYSIS;
SYNTHESIS (CHEMICAL);
X RAY CRYSTALLOGRAPHY;
COMPRESSIVE STRESSES;
ELASTIC THEORY;
MICROCRYSTALLINE MATERIALS;
CUBIC BORON NITRIDE;
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EID: 0031223251
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.36.l1236 Document Type: Article |
Times cited : (4)
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References (21)
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