Effect of film thickness on ferroelectric properties of sol-gel-derived Pb(Ti, Al)O3 thin films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 9 SUPPL. B, 1997, Pages 5829-5833

  Iijima, Takashi ^a   Kudo, Setuko ^b   Sanada, Norio ^a  

^a TOHOKU NATL INDUST RES INSTITUTE   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

Aluminum doping; Ferroelectric properties; Film thickness; Lead titanate; Oxygen vacancy; Sol gel; Thin film

Indexed keywords

ALUMINUM; DOPING (ADDITIVES); FERROELECTRICITY; GRAIN BOUNDARIES; LEAD COMPOUNDS; PERMITTIVITY; SOL-GELS; THIN FILMS;

LEAD TITANATE;

FERROELECTRIC MATERIALS;

EID: 0031222992     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.5829     Document Type: Article

References (11)

1. A. Ariizumi, K. Kawamura, I. Kikuchi and I. Kato: Proc. 5th Meet. Ferroelectric Materials & Their Applications, Kyoto 1985, Jpn. J. Appl. Phys. 24 (1985) Suppl. 24-3, p. 7.
2. M. Okuyama and Y. Hamakawa: Ferroelectrics 63 (1985) 243.
3. H. Funakubo, T. Hioki, M. Otsu, K. Shinozaki and N. Mizutani: Jpn. J. Appl. Phys. 32 (1993) 4175.
4. H. Maiwa, N. Ichinose and K. Okazaki: Jpn. J. Appl. Phys. 33 (1994) 5277.
5. Y. Sakashita, H. Segawa, K. Tominaga and M. Okada: J. Appl. Phys. 73 (1993) 7857.
6. K. Amanuma, T. Mori, T. Hase, T. Sakuma, A. Ochi and Y. Miyasaka: Jpn. J. Appl. Phys. 32 (1993) 4150.
7. R. B. Atkin and R. M. Fulrath: J. Am. Ceram. Soc. 54 (1971) 265.
8. T. Tani and D. A. Payne: J. Am. Ceram. Soc. 77 (1994) 1242.
9. T. Iijima and N. Sanada: to be published in Proc. 2nd Int. Meet. Pac. Rim Ceram. Soc., Cairns, 1996.
10. T. Iijima and N. Sanada: Jpn. J. Appl. Phys. 35 (1996) 4930.
11. S. Ikegami, I. Ueda and T. Nagata: J. Acoust. Soc. Am. 50 (1971) 1060.