Interfacial roughness and magnetoresistance in Co/Cu multilayers

Thin Solid Films

Volumn 306, Issue 2, 1997, Pages 326-330

  Wawro, A ^a   Baczewski, L T ^a   Kalinowski, R ^a   Aleszkiewicz, M ^a   Rauluszkiewicz J ^a  

^a INSTITUTE OF PHYSICS   (Poland)

Author keywords

Giant magnetoresistance in Co Cu multilayers; Interfacial roughness; Magnetic coupling in Co Cu multilayers; Metallic multilayer structures; Scanning tunneling microscopy of metallic layered structures; Ultrahigh vacuum deposition

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COBALT; COPPER; DEPOSITION; INTERFACES (MATERIALS); MAGNETIZATION; MAGNETORESISTANCE; METALLIC FILMS; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; X RAY ANALYSIS;

GIANT MAGNETORESISTANCE (GMR) EFFECT; MAGNETIC COUPLING; ULTRAHIGH VACUUM DEPOSITION;

METALLIC SUPERLATTICES;

EID: 0031222966     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00288-5     Document Type: Article

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