Dependency of Coercivity on Co Layer Thickness in Co/Cu Multilayer Structures

IEEE Transactions on Magnetics

Volumn 33, Issue 5 PART 2, 1997, Pages 3529-3531

  Cheng, S F ^a  

^a NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; COERCIVE FORCE; COPPER; FERROMAGNETIC MATERIALS; INTERFACES (MATERIALS); MAGNETIC ANISOTROPY; MAGNETIC PROPERTIES; METALLIC SUPERLATTICES; STRUCTURE (COMPOSITION);

MAGNETOCRYSTALLINE ANISOTROPY;

MAGNETIC FILMS;

EID: 0031222689     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.619487     Document Type: Article

References (7)

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6. J. J. Rehr, J. M. d. Leon, S. I. Zabinsky, and R. C. Albers, Theoretical X-ray absorption fine structure standards, J. Amer. Chem. Soc., 113, (1991X5135-5140.
7. O. Heckmann, H. Magnan, P. 1. Fevre, D. Chandesris, and J. J. Rehr, Crystallographic structure of cobalt films on Cu (001): elastic deformation to a tetragonal structure, Surface Science, 312, (1994), 62-72.