Microstructural evolution and growth of crystallite size of mullite during thermal transformation of kyanite

Journal of the European Ceramic Society

Volumn 17, Issue 11, 1997, Pages 1277-1284

  Sainz, M A ^a   Serrano, F J ^b   Bastida, J ^b   Caballero, A ^a  

^a INSTITUTO DE CERÁMICA Y VIDRIO   (Spain)

^b UNIVERSITY OF VALENCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; GRAIN SIZE AND SHAPE; HEAT TREATMENT; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CRYSTALLITES; KYANITE; MULLITE;

CLAY MINERALS;

EID: 0031222629     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0955-2219(96)00231-2     Document Type: Article

References (16)

1. Schneider, H., Okada, K. and Pask, J. A., Mullite and Mullite Ceramics. John Wiley and Sons, Chichester, 1994, pp. 1-251.
2. Sacks, M. D., Lee, H. and Pask, J. A., Mullite and mullite matrix composites. In Ceramics Transactions, vol. 6, ed. S. Somiya, R. F. Davis and J. A. Pask. Am. Ceram. Soc., Westerville, OH, 1990, pp. 167-207.
3. Warren, B. E. and Averbach, B. C., The effect of cold-work distortion on X-ray patterns. J. Appl. Phys., 1950, 21, 595-599.
4. Delhez, R., De Keijser, Th. H. and Mittemeijer, E. J., Determination of crystalline size and lattice distortions through X-ray diffraction line profile analysis. Fresenius Z. Anal. Chem., 1982, 312, 1-16.
5. Wancheng, Z., Litong, Z. and Hengzhi, F., Modification of the hydrofluoric acid leaching technique: Part I. J. Am. Ceram. Soc., 1988, 71(5), 395-398.
6. Will, G., Parrish, W. and Huang, T. C., Crystal-structure refinement by profile fitting and least-squares analysis of powder diffractometer data. J. Appl. Cryst. 1983, 16, 611-622.
7. Langford, J. I., A rapid method for analysing breadths of diffraction and spectral lines using the Voigt function. J. Appl. Cryst., 1978, 11, 10-14.
8. De Keijser, Th. H., Langford, J. I., Mittemeijer, E. J. and Vogels, A. B. P., Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening. J. Appl. Cryst., 1982, 15, 308-314.
9. Schneider, H. and Majdic, A., Kinetics of the thermal decomposition of kyanite. Ceramurgia Intern., 1980, 6, 61-66.
10. 2 mixtures. Am. Ceram. Soc. Bull., 1982, 61(8), 838-842.
11. Balzar, D., Profile fitting of X-ray diffraction lines and Fourier analysis of broadening. J. Appl. Cryst., 1992, 25, 559-570.
12. Dowty, E. and Shape, A computer program for drawing crystals. J. Appl. Cryst., 1988, 21, 211-220.
13. Serrano, F. J., Análisis microestructural de mullitas por difracción de rayos X. Ph D thesis, Universidad Valencia, Burjassot, Valencia, Spain, 1995.
14. Serrano, F. J., Bastida, J., Amigo, J. M. and Sainz, A., XRD Line broadening studies on mullite. Cryst. Res. Technol. 1996, 31(8), 1085-1093.
15. Sainz, M. A., Obtencion de mullita a partir de la transformación termica de cianita. Ph D thesis, Universidad Autónoma, Madrid, Spain, 1995.
16. Hirata, Y. and Aksay, I. A., Grain growth of mulllite. Conference paper presented at 94th Annual Meeting of Am. Ceram. Soc., Minneapolis, 1992.