In-situ ellipsometry and SHG measurements of the growth of CdS layers on CdxHg1-xTe

Journal of Electroanalytical Chemistry

Volumn 435, Issue 1-2, 1997, Pages 173-178

  Wark, A ^a   Berlouis, L E A ^a   Jackson, F ^a   Lochran, S ^a   Cruickshank, F R ^a   Brevet, P F ^b  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^b EPFL   (Switzerland)

Author keywords

Anisotropy measurements; CdS films; Ellipsometry; Second harmonic generation

Indexed keywords

ANISOTROPY; CRYSTAL IMPURITIES; ELLIPSOMETRY; FILM GROWTH; NONLINEAR OPTICS; REFRACTIVE INDEX; SECOND HARMONIC GENERATION; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR GROWTH;

CADMIUM MERCURY TELLURIDE;

SEMICONDUCTING FILMS;

EID: 0031222596     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(97)00302-1     Document Type: Article

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