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Volumn 52, Issue 11, 1997, Pages 1695-1709
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The continuous on-line monitoring of the trace elemental composition of industrial ethene gas by means of inductively coupled plasma mass spectrometry
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Author keywords
ICP MS; Industrial ethene; On line monitoring
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Indexed keywords
IMPURITIES;
MASS SPECTROMETRY;
NITROGEN;
ONLINE SYSTEMS;
PLASMA APPLICATIONS;
TRACE ELEMENTS;
ETHENE;
INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETRY (ICP AES);
OLEFINS;
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EID: 0031222407
PISSN: 05848547
EISSN: None
Source Type: Journal
DOI: 10.1016/S0584-8547(97)00055-4 Document Type: Article |
Times cited : (6)
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References (26)
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