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Volumn 7, Issue 3, 1997, Pages 139-152

The effect of fault size on testing

Author keywords

Fault size; Operational testing; Reliability; Software testing

Indexed keywords

RELIABILITY; SOFTWARE ENGINEERING;

EID: 0031222041     PISSN: 09600833     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1689(199709)7:3<139::AID-STVR136>3.0.CO;2-R     Document Type: Article
Times cited : (4)

References (15)
  • 1
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    • (1989) IEEE Software , vol.6 , Issue.3 , pp. 31-36
    • Ackerman, A.F.1    Buchwald, L.S.2    Lewski, F.H.3
  • 2
    • 0021199968 scopus 로고
    • Optimizing preventive service of software products
    • Adams, E. (1984) 'Optimizing preventive service of software products', IBM Journal of Research and Development, 28(1), 2-14.
    • (1984) IBM Journal of Research and Development , vol.28 , Issue.1 , pp. 2-14
    • Adams, E.1
  • 5
    • 0017292244 scopus 로고
    • Design and code inspections to reduce errors in program development
    • Fagan, M. E. (1976) 'Design and code inspections to reduce errors in program development', IBM Systems Journal, 15(3), 182-211.
    • (1976) IBM Systems Journal , vol.15 , Issue.3 , pp. 182-211
    • Fagan, M.E.1
  • 8
    • 0004311122 scopus 로고
    • UNIX Supplementary Documents, Bell Labs, New Jersey, U.S.A. November
    • Johnson, S. C. (1986) 'Lint, a C Program Checker', UNIX Supplementary Documents, Bell Labs, New Jersey, U.S.A. November.
    • (1986) Lint, a C Program Checker
    • Johnson, S.C.1
  • 9
    • 0022721004 scopus 로고
    • The effects of inspections on software quality and productivity
    • Kitchenham, B. A., Kitchenham, A. P. and Fellows J. P. (1986) 'The effects of inspections on software quality and productivity', ICL Technical Journal, 5(1), 112-122.
    • (1986) ICL Technical Journal , vol.5 , Issue.1 , pp. 112-122
    • Kitchenham, B.A.1    Kitchenham, A.P.2    Fellows, J.P.3
  • 10
    • 0019262458 scopus 로고
    • What makes a reliable program - Few bugs or a small failure rate
    • Anaheim, California, U.S.A., AFIPS Press, Arlington, Virginia, U.S.A.
    • Littlewood, B. (1980) 'What makes a reliable program - few bugs or a small failure rate', Proceedings of the National Computer Conference, Anaheim, California, U.S.A., pp. 707-713, AFIPS Press, Arlington, Virginia, U.S.A.
    • (1980) Proceedings of the National Computer Conference , pp. 707-713
    • Littlewood, B.1
  • 11
    • 0019622073 scopus 로고
    • Stochastic reliability growth, a model for fault removal in computer programs and hardware designs
    • Littlewood, B. (1981) 'Stochastic reliability growth, a model for fault removal in computer programs and hardware designs', IEEE Transactions on Reliability, 30(4), 313-320.
    • (1981) IEEE Transactions on Reliability , vol.30 , Issue.4 , pp. 313-320
    • Littlewood, B.1
  • 13
    • 0023211250 scopus 로고
    • Experiments in software reliability estimation
    • Mellor, P. (1987) 'Experiments in software reliability estimation', Reliability Engineering, 18(2), 117-129.
    • (1987) Reliability Engineering , vol.18 , Issue.2 , pp. 117-129
    • Mellor, P.1
  • 15
    • 0003671714 scopus 로고
    • McGraw-Hill, Maidenhead, U.K.
    • Roper, M. (1994) Software Testing, McGraw-Hill, Maidenhead, U.K.
    • (1994) Software Testing
    • Roper, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.