Magnetic resonance force microscopy with a permanent magnet on the cantilever

IEEE Transactions on Magnetics

Volumn 33, Issue 5 PART 2, 1997, Pages 4047-4049

  Zhang, Z ^a   Hammel, P C ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MAGNETIC FIELD EFFECTS; MAGNETIC THIN FILMS; NEODYMIUM COMPOUNDS; PERMANENT MAGNETS;

MAGNETIC RESONANCE FORCE MICROSCOPY (MRFM); PERMANENT MAGNETIC MICROPARTICLES;

MAGNETIC RESONANCE IMAGING;

EID: 0031222022     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.619658     Document Type: Article

References (6)

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3. D. Rugar, O. Zügar, S. Hoen, C. S. Yannoni, H. -M. Vieth, and R. D. Kendrick, "Force detection of nuclear magnetic resonance," Science, Vol. 264, pp. 1560-1563, June 1994.
4. O. Zügar and D. Rugar, "First images from a magnetic resonance force microscope," Appl. Phys. Lett., Vol. 63, pp. 2496-2498, November 1993.
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6. Z. Zhang, P. C. Hammel, and P. E. Wigen, "Observation of ferromagnetic resonance in a microscopic sample using magnetic resonance force microscopy,"J. Phys. Lett., Vol. 68, pp. 2005-2007, April 1996.