Safety issues in the comparative analysis of dependable architectures

IEEE Transactions on Reliability

Volumn 46, Issue 3, 1997, Pages 316-322

  Choi, Charles Y ^a   Johnson, Barry W ^b   Profeta, Joseph A ^a  

^a UNIVERSITY OF VIRGINIA   (United States)

^b Union Switch & Signal Company   (United States)

Author keywords

Dependability; Fault tolerance; Markov chains; Reliability; Safety

Indexed keywords

COMPUTER ARCHITECTURE; MARKOV PROCESSES; MATHEMATICAL MODELS; RELIABILITY;

HARD FAIL ARCHITECTURES; LIFE CRITICAL APPLICATIONS HARDWARE;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0031221097     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.664002     Document Type: Article

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