Thermal and electrical reliability of dual-stripe MR heads

IEEE Transactions on Magnetics

Volumn 33, Issue 5 PART 1, 1997, Pages 2914-2916

  Zolla, Howard G ^a,b  

^a Headway Technologies Inc   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ELECTRIC CURRENTS; FAILURE ANALYSIS; MAGNETIC RECORDING; MAGNETORESISTANCE; MATHEMATICAL MODELS; SERVICE LIFE;

DUAL STRIPE MAGNETORESISTIVE RECORDING (DSMR) HEADS;

MAGNETIC HEADS;

EID: 0031220824     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.617796     Document Type: Article

References (5)

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2. G.E. Moore, P.A. Turner and K..L. Tai, "Current density limitations in permalloy magnetic detectors, " AIP Conf. Proc., vol 10, pp. 217-21, 1972.
3. A. Gangulee and P.M. d'Heurle, "Electromigration and diffusion in Ni-Fe thin films," Japan J. Appl. Phys. Suppl. Vol. 2, pp. 625-7, 1974.
4. nd ed., New York:McGraw-Hill, 1992, chapter 3.
5. P. Tobias and D. Trindade, Applied Reliability, New York:Van Nostrand, 1995, chapters.