Grazing incidence reflectivity and total electron yield effects in soft x-ray absorption spectroscopy

Journal of Applied Physics

Volumn 82, Issue 6, 1997, Pages 3120-3124

  Alders, D ^a   Hibma, T ^a   Sawatzky, G A ^a   Cheung, K C ^b   Van Dorssen, G E ^b   Roper, M D ^b   Padmore, H A ^b   Van Der Laan, G ^b   Vogel, J ^c   Sacchi, M ^c  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

^b DARESBURY LABORATORY   (United Kingdom)

^c UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CHARGE TRANSFER; DIELECTRIC PROPERTIES; FUNCTIONS; LIGHT POLARIZATION; LIGHT REFLECTION; MATHEMATICAL MODELS; NICKEL COMPOUNDS; X RAY SPECTROSCOPY;

FRESNEL EQUATION; GRAZING INCIDENCE; NICKEL OXIDE; REFLECTION SPECTROSCOPY; SOFT X RAY ABSORPTION SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 0031220773     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366153     Document Type: Article

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