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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 9 A, 1997, Pages 5753-5758

A self-sensitive probe composed of a piezoelectric tuning fork and a bent optical fiber tip for scanning near-field optical/atomic force microscopy

(6) Muramatsu, Hiroshi a Yamamoto, Noritaka a Umemoto, Takeshi a Homma, Katsunori a Chiba, Norio a Fujihira, Masamichi b

a SEIKO INSTRUMENTS INC (Japan)

b TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

AFM; Imaging; Near field optical microscopy; Optical fiber; Piezoelectric tuning fork; Scanning probe microscopy; Self sensitive probe; SNOM

Indexed keywords

ATOMIC FORCE MICROSCOPY; NATURAL FREQUENCIES; OPTICAL FIBERS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PIEZOELECTRIC DEVICES; PROBES; SPECTROGRAPHS;

PIEZOELECTRIC TUNING FORK; SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM); SELF SENSITIVE PROBES;

MICROSCOPES;

EID: 0031220571 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.36.5753 Document Type: Article

Times cited : (10)

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