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Volumn 38, Issue 9, 1997, Pages 780-786
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Effect of hydriding on structural stability of Ni/Ti and Pd/Ti multilayers
a a a a |
Author keywords
Auger electron depth profiling; Free energy diagram; Hydriding; Interlayer mixing; Nickel titanium and palladium titanium multilayers; Solid state amorphization; Transmission electron microscopy; X ray diffraction
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Indexed keywords
AMORPHIZATION;
ANNEALING;
AUGER ELECTRON SPECTROSCOPY;
COMPOSITION EFFECTS;
ION BEAMS;
METALLIC FILMS;
NICKEL ALLOYS;
PALLADIUM ALLOYS;
SPUTTERING;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
ATOMIC INTERLAYER MIXING;
HYDRIDING;
METALLIC SUPERLATTICES;
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EID: 0031220387
PISSN: 09161821
EISSN: None
Source Type: Journal
DOI: 10.2320/matertrans1989.38.780 Document Type: Article |
Times cited : (8)
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References (12)
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