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Volumn 38, Issue 9, 1997, Pages 780-786

Effect of hydriding on structural stability of Ni/Ti and Pd/Ti multilayers

Author keywords

Auger electron depth profiling; Free energy diagram; Hydriding; Interlayer mixing; Nickel titanium and palladium titanium multilayers; Solid state amorphization; Transmission electron microscopy; X ray diffraction

Indexed keywords

AMORPHIZATION; ANNEALING; AUGER ELECTRON SPECTROSCOPY; COMPOSITION EFFECTS; ION BEAMS; METALLIC FILMS; NICKEL ALLOYS; PALLADIUM ALLOYS; SPUTTERING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0031220387     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.38.780     Document Type: Article
Times cited : (8)

References (12)
  • 4
    • 0003586087 scopus 로고
    • ed. by Y. Sakurai, Y. Hamakawa, T. Masumoto, K. Shirane and K. Suzuki, North-Holland, Amsterdam
    • M. Matsuura: Current Topics in Amorphous Materials, ed. by Y. Sakurai, Y. Hamakawa, T. Masumoto, K. Shirane and K. Suzuki, North-Holland, Amsterdam, (1993), p. 127.
    • (1993) Current Topics in Amorphous Materials , pp. 127
    • Matsuura, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.