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Volumn 12, Issue 3, 1997, Pages 271-287

Combining functional and structural reasoning for safety analysis of electrical designs

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; FAILURE ANALYSIS; USER INTERFACES;

EID: 0031220149     PISSN: 02698889     EISSN: None     Source Type: Journal    
DOI: 10.1017/S0269888997003020     Document Type: Article
Times cited : (17)

References (19)
  • 2
    • 9644311142 scopus 로고
    • Computer-based failure mode and effects analysis for quality management - A case study
    • Coker, AO, Smith, JA, Higgins, S and Cameron, DC, 1989. "Computer-based failure mode and effects analysis for quality management - a case study" Quality Assurance 15 (3) 89-94.
    • (1989) Quality Assurance , vol.15 , Issue.3 , pp. 89-94
    • Coker, A.O.1    Smith, J.A.2    Higgins, S.3    Cameron, D.C.4
  • 3
    • 34147120474 scopus 로고
    • A note on two problems in connection with graphs
    • Dijkstra, EW, 1959. "A note on two problems in connection with graphs" Numerishe Math 1 269-271.
    • (1959) Numerishe Math , vol.1 , pp. 269-271
    • Dijkstra, E.W.1
  • 6
    • 0027708353 scopus 로고
    • Qualitative modelling of the effects of electrical circuit faults
    • Lee, MH and Ormsby, ART, 1993. "Qualitative modelling of the effects of electrical circuit faults" Artificial Intelligence in Engineering 8 293-300.
    • (1993) Artificial Intelligence in Engineering , vol.8 , pp. 293-300
    • Lee, M.H.1    Ormsby, A.R.T.2
  • 7
    • 0018019662 scopus 로고
    • Computerized approach for matrix-form FMEA
    • October
    • Legg, JM, 1978. "Computerized approach for matrix-form FMEA" IEE Transactions on Reliability R-27 (4) October.
    • (1978) IEE Transactions on Reliability , vol.R-27 , Issue.4
    • Legg, J.M.1
  • 8
    • 0025692441 scopus 로고
    • Computer-aided failure mode and effects analysis of electronic circuits
    • Lehtela, M, 1990. "Computer-aided failure mode and effects analysis of electronic circuits" Microelectronics Reliability 30 (4), 761-773.
    • (1990) Microelectronics Reliability , vol.30 , Issue.4 , pp. 761-773
    • Lehtela, M.1
  • 16
    • 84974743798 scopus 로고
    • Viewing computer-aided failure mode and effects analysis from an artificial intelligence perspective
    • Russomanno, DJ, Bonnell, RD and Bowles, JB, 1994. "Viewing computer-aided failure mode and effects analysis from an artificial intelligence perspective" Integrated Computer-Aided Design 1 (3) 209-228.
    • (1994) Integrated Computer-Aided Design , vol.1 , Issue.3 , pp. 209-228
    • Russomanno, D.J.1    Bonnell, R.D.2    Bowles, J.B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.