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Volumn 1318, Issue , 1997, Pages 156-169

New developments in full field strain measurements using speckles

Author keywords

Digital image processing; Electron microscope; Experimental mechanics; Interferometry; Micro mechanics; Speckle; Stress strain analysis

Indexed keywords

COMPOSITE MICROMECHANICS; DIGITAL IMAGE STORAGE; ELECTRON MICROSCOPY; IMAGE ANALYSIS; INTERFEROMETRY; PHOTOGRAPHY; SPECKLE; STRESS ANALYSIS;

EID: 0031213176     PISSN: 00660558     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (52)

References (16)
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  • 4
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  • 5
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  • 7
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.