Noise sources in step-scan FT-IR spectrometry

Applied Spectroscopy

Volumn 51, Issue 8, 1997, Pages 1092-1101

  Manning, Christopher J ^a   Griffiths, Peter R ^b  

^a Manning Applied Technology   (United States)

^b UNIVERSITY OF IDAHO   (United States)

Author keywords

FT IR spectrometry; Multiplicative noise; Signal to noise ratio; Step scanning; Temperature effects; Thermal stability

Indexed keywords

REFRACTIVE INDEX; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS; THERMODYNAMIC STABILITY; VIBRATION MEASUREMENT;

MULTIPLICATIVE NOISE;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

EID: 0031213137     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702971941755     Document Type: Article

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